Hello fellows,
I'll have the possibilites to access a CT scan at a local research facility. The CT is said to offer details in the 0.000001m range.
One scan run takes about 45min, in total I'll have about 3h access to the scanner.
Already set are scans of:
- a defective TDA1541A
- defective/faked AD1862
- re-labeled PCM58
In my inventory I further have:
- PCM69
- PCM67
- PCM1794a
- AD1865
- AD1955
- CS4328 (my personal favorite)
- TDA1540
- TDA1387
- TDA1305
- various digital filter ICs (DF1706, SM5813, SM5842, YSF210, YM3434
There is one requirement that I was ordered to: To describe the test objectives....
I thought I can argue about the defective parts (identify the failure mode) and the old-school "hybrid", e.g. Bipolar/CMOS/CrNi parts.
I have no real arguments about the latter standard-CMOS parts, so maybe one of you fellows have some input...
Cheers, Markus